MSE 4003 Exam 1 Acronym Problem Set
AFM
Atomic Force Microscopy
AES
Auger Electron Spectroscopy
BSED
Back-Scattered Electron Detector
BGPL
Beam-Gas Path Length
BF
Bright Field
CLSM
Confocal Laser Scanning Microscopy
CSEM
Conventional Scanning Electron Microscope
DF
Dark Field
DCPD
Di-Calcium Phosphate Dihydrate
DIC
Differential Interference Contrast
DSC
Differential Scanning Calorimetry
DTA
Differential Thermal Analysis
EDM
Electric Discharge Machining
EBSD
Electron Back-Scattered Diffraction
ESEM
Environmental Scanning Electron Microscope
FFT
Fast Fourier Transform
FEG
Field Emission Gun
FIB
Focused Ion Beam
FTIR
Fourier Transform Infra-red
FWHM
Full Width at Half Maximum
GFIS
Gas Field Ion Source
GIS
Gas Injection System
HDPE
High Density Polyethylene
HRTEM
High Resolution Transmission Electron Microscopy
HRXRD
High Resolution X-Ray Diffractometry
ICDD
International Center For Diffraction Data
LMIS
Liquid Metal Ion Source
LDPE
Low Density Polyethylene
LV-SEM
Low-Vacuum Scanning Electron Microscope
MCP
Micro-Channel Plate
NA
Numerical Aperture
OCP
Ortho-Calcium Phosphate
PMT
Photo-Multiplier Tube
PEEK
Poly-Ether Ether Ketone
POE
Poly-Olefin Elastomer
PBT
Polybutylene Terephthalate
PC
Polycarbonate
Powder Diffraction File
PLA
Pressure-Limiting Aperture
SEM
Scanning Electron Microscopy
SPM
Scanning Probe Microscopy
SAD
Selected Area Diffraction
SWL
Short Wavelength Limit
SAXS
Small Angle X-ray Scattering
TEM
Transmission Electron Microscopy
UHMWPE
Ultra-High Molecular Weight Polyethylene
VLM
Visible Light Microscopy
WAXD
Wide Angle X-ray Diffraction
XRD
X-Ray Diffraction
XRF
X-Ray Fluorescence
XPS
X-ray Photoelectron Spectroscopy
